DocumentCode
1549399
Title
Complex modes in shielded suspended coupled microstrip lines
Author
Kuo, Jen-Tsai ; Tzuang, Ching-Kuang C.
Author_Institution
Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
38
Issue
9
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
1278
Lastpage
1286
Abstract
The existence of complex modes in electrically shielded suspended coupled microstrip lines has been studied extensively, and the results are presented. A rigorous full-wave spectral-domain approach (SDA) with a newly proposed and tested set of basis functions can efficiently and accurately determine the propagation characteristics of the dominant, higher-order, and complex modes for planar or quasi-planar transmission lines. These basis functions are validated by comparing the convergence study of field solutions with those obtained by various sets of preconditioned bases and by the unconditioned subdomain ones. Excellent agreement is obtained for the propagation constants and the normalized complex longitudinal and transverse current distributions on conducting strips for the strongly coupled microstrip lines. For all the particular case studies discussed, it is shown that the complex modes may exist in all the shielded suspended coupled microstrip lines, even when the substrate dielectric constant is low. Theoretical results for the fundamental, higher-order, evanescent, and complex modes are presented for suspended coupled microstrip lines
Keywords
strip lines; waveguide theory; complex modes; conducting strips; current distributions; evanescent modes; fundamental mode; higher order modes; propagation characteristics; propagation constants; rigorous full-wave spectral-domain approach; shielded suspended coupled microstrip lines; strongly coupled microstrip lines; Couplings; Current distribution; Dielectric constant; Dielectric substrates; Microstrip components; Planar transmission lines; Propagation constant; Strips; Testing; Transmission line theory;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.58654
Filename
58654
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