DocumentCode
1549438
Title
Three-dimensional finite-element solution of dielectric scattering obstacles in a rectangular waveguide
Author
Ise, Kiyoshi ; Inoue, Kazuhiro ; Koshiba, Masanori
Author_Institution
Dept. of Electron. Eng., Hokkaido Univ., Sapporo, Japan
Volume
38
Issue
9
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
1352
Lastpage
1359
Abstract
A numerical approach is described for the analysis of scattering from dielectric obstacles in a rectangular waveguide. The approach is a combination of the finite-element method and the analytical solution. In order to save computer memory, the substructure method is introduced in the finite-element method. To combine the uniform waveguide region with the finite-element-method region, evanescent modes and propagating modes are considered in the analytical solution. Spurious fields like the spurious solutions generated in the finite-element analysis of three-dimensional eigenvalue problems can appear in the three-dimensional discontinuity problems when the variational expression in terms of three components of the magnetic field is used. To suppress and eliminate the spurious fields, the penalty function method is also introduced. To confirm the validity and usefulness of the approach, numerical examples are shown for a rectangular dielectric scattering obstacle in a waveguide
Keywords
dielectric-loaded waveguides; finite element analysis; rectangular waveguides; waveguide theory; 3D FEA; analytical solution; dielectric scattering obstacles; evanescent modes; finite-element method; numerical examples; penalty function method; propagating modes; rectangular waveguide; spurious fields elimination; substructure method; three-dimensional discontinuity problems; uniform waveguide region; validity; variational expression; Dielectrics; Eigenvalues and eigenfunctions; Electromagnetic analysis; Finite element methods; Magnetic analysis; Magnetic fields; Planar waveguides; Rectangular waveguides; Scattering; Waveguide discontinuities;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.58664
Filename
58664
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