DocumentCode :
1549489
Title :
Full-wave analysis of a strip crossover
Author :
Papatheodorou, Stilianos ; Mautz, Joseph R. ; Harrington, Roger F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Syracuse Univ., NY, USA
Volume :
38
Issue :
10
fYear :
1990
fDate :
10/1/1990 12:00:00 AM
Firstpage :
1439
Lastpage :
1448
Abstract :
A full-wave analysis of a strip crossover above a conducting plane is carried out. Higher-order modes are excited in the form of evanescent waves in the vicinity of the discontinuity, while further away only the dominant (TEM) modes exist. The higher-order mode currents are modeled by triangle functions and the dominant modes by outgoing traveling waves. The method of moments is used to reduce the integral equations on the surface of each strip to matrix equations whose solution determines the currents on each strip. The impedance and scattering matrices of the four-port network and the equivalent circuit were determined. At low frequencies, the equivalent circuit agrees very well with that which was obtained previously using a quasi-static analysis. The two approaches begin to disagree when the cross-sectional dimensions of the crossover become comparable to a tenth of the wavelength. At that point the quasi-static analysis becomes inaccurate, while the full-wave analysis presented here remains valid
Keywords :
S-matrix theory; equivalent circuits; strip line components; strip lines; waveguide theory; TEM modes; conducting plane; discontinuity; dominant modes; equivalent circuit; evanescent waves; four-port network; full-wave analysis; higher-order mode currents; impedance; integral equations; matrix equations; moments method; outgoing traveling waves; scattering matrices; strip crossover; triangle functions; Dielectric substrates; Equivalent circuits; Frequency; Integral equations; Microwave integrated circuits; Moment methods; Packaging; Stripline; Strips; Transmission line matrix methods;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.58683
Filename :
58683
Link To Document :
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