• DocumentCode
    1549595
  • Title

    Reliability concept for electric fuses

  • Author

    Meng, X.Z. ; Sloot, J.G.J.

  • Author_Institution
    Fac. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
  • Volume
    144
  • Issue
    2
  • fYear
    1997
  • fDate
    3/1/1997 12:00:00 AM
  • Firstpage
    87
  • Lastpage
    92
  • Abstract
    When fuses are subjected to current pulses, cyclic stress is induced owing to temperature variations. Damage in the fuse elements is gradually accumulated and results in resistance increase. Consequently, current-time characteristics shift to effect early operation during the normal service period. Under such circumstances, proper protection required for other equipment will not be achieved. Reliability concerns for after sales service arise owing to these facts. The paper presents a method for predicting lifetimes of fuses for cyclic loading. The physical model is based on the description of elastic, plastic and creep deformation during a series of current pulses. In comparison with existing methods and IEC recommendations, it has the advantage of requiring a very limited number of tests. Results from the physical model can be used to evaluate practical fuse designs and provide advanced information for fuse replacements. The method has been demonstrated for commercial time-lag miniature fuses, low-voltage fuses with M-effect, low-voltage fuses for semiconductor protection, and high-voltage fuses for motor protection
  • Keywords
    creep; elastic deformation; electric fuses; life testing; plastic deformation; reliability; thermal stresses; IEC tests; M-effect; creep deformation; current pulses; current-time characteristics; cyclic stress; elastic deformation; electric fuses; fuse ageing; fuse lifetime prediction method; high-voltage fuses; low-voltage fuses; motor protection; physical model; plastic deformation; reliability concept; semiconductor protection fuses; temperature variations; time-lag miniature fuses;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:19970861
  • Filename
    587041