Title :
Guest Editor´s Introduction: test and product life cycle
Author :
Ambler, T. ; Bennetts, B.
Author_Institution :
University of Texas at Austin
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Costs; Debugging; Electronic equipment testing; Extrapolation; Fault detection; Life testing; Software testing; Switches; System testing; Time to market;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1999.785823
