Title :
Design for test and time to market: a personal perspective
Author_Institution :
Syntest Technol. Inc., Sunnyvale, CA, USA
fDate :
6/21/1905 12:00:00 AM
Abstract :
This article explores design for test implementation alternatives and electronic design for test automation´s effects on overall time to market
Keywords :
computer testing; design for testability; logic testing; automation; design for test; electronic design for test; test implementation; time to market; Assembly; Automatic test pattern generation; Automatic testing; Built-in self-test; Costs; Design for testability; Electronic equipment testing; Feedback loop; Humans; Time to market;
Journal_Title :
Design & Test of Computers, IEEE
