• DocumentCode
    1549730
  • Title

    Design for test and time to market: a personal perspective

  • Author

    Turino, Jon

  • Author_Institution
    Syntest Technol. Inc., Sunnyvale, CA, USA
  • Volume
    16
  • Issue
    3
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    23
  • Lastpage
    27
  • Abstract
    This article explores design for test implementation alternatives and electronic design for test automation´s effects on overall time to market
  • Keywords
    computer testing; design for testability; logic testing; automation; design for test; electronic design for test; test implementation; time to market; Assembly; Automatic test pattern generation; Automatic testing; Built-in self-test; Costs; Design for testability; Electronic equipment testing; Feedback loop; Humans; Time to market;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.785824
  • Filename
    785824
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1549730