Title :
A 550-
10-b 40-MS/s SAR ADC With Multistep Addition-Only Digital Error Correction
Author :
Cho, Sang-Hyun ; Lee, Chang-Kyo ; Kwon, Jong-Kee ; Ryu, Seung-Tak
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Abstract :
A speed-enhanced 10-b asynchronous SAR ADC with multistep addition-only digital error correction (ADEC) is presented with a straightforward DAC switching algorithm. The capacitor DAC is virtually divided into three sub-DACs for ADEC with negligible hardware overhead. The redundant decision cycles between stages reconfigure the capacitor connection of the DAC. These redundancies guarantee 10-b linearity under 4-b-accurate DAC settling in the MSB decision and the optimally designed ADC enhances the conversion speed by 37%. A prototype ADC was implemented in a CMOS 0.13-μm technology. The chip consumes 550 μW and achieves a 50.6-dB SNDR at 40 MS/s under a 1.2-V supply. The figure-of-merit (FOM) is 50 fJ/conversion-step.
Keywords :
CMOS integrated circuits; analogue-digital conversion; capacitors; digital-analogue conversion; error correction; redundancy; CMOS technology; DAC switching algorithm; MSB decision; multistep addition only digital error correction; power 550 muW; redundant decision cycle; size 0.13 mum; speed enhanced asynchronous SAR ADC; voltage 1.2 V; word length 10 bit; Algorithm design and analysis; Capacitors; Error correction; Power demand; Prototypes; Redundancy; Switches; Addition-only digital error correction (ADEC); SAR ADC; asynchronous; digital error correction; multistep binary error correction;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2011.2151450