Title :
Theorem design of test structures matrix type as systems of recognition of images, events, signs, devices
Author :
Zaharov, A.A. ; Tkachenko, I.M. ; Kozhanova, E.R.
Author_Institution :
Yuri Gagarin State Tech. Univ. of Saratov, Saratov, Russia
Abstract :
Article use this procedure to build composite test matrix structures as pattern recognition systems. The authors presented the theorem transformation test tracks in the expert system. Also see logistic models of such structures.
Keywords :
expert systems; image recognition; matrix algebra; composite test matrix structures; devices; events recognition; expert system; images recognition; logistic models; pattern recognition systems; signs recognition; theorem design; theorem transformation test; Control systems; Educational institutions; Expert systems; Image recognition; Logistics; Pattern recognition; Process control;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2014 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4799-3437-9
DOI :
10.1109/APEDE.2014.6958233
