DocumentCode :
1550301
Title :
Simulation of Warpage During Fabrication of Printed Circuit Boards
Author :
Kim, Sung-Won ; Lee, Sang-Hyuk ; Kim, Dae-Jin ; Kim, Sun Kyoung
Author_Institution :
Grad. Sch. of NID Fusion Technol., Seoul Nat. Univ. of Sci. & Technol., Seoul, South Korea
Volume :
1
Issue :
6
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
884
Lastpage :
892
Abstract :
This paper presents a simulation method for the warpage that take places after the patterning process of printed circuit boards. To conduct an efficient as well as realistic simulation, a nonlinear thermo-elasticity problem with cure kinetics is approximated to a linear one by adjusting the thermal loading condition, which is the processing temperature where the stress-free state is assumed. This paper proposes a method that can determine such temperature based on a simple experiment. Moreover, methods for geometric modeling and meshing with finite elements are also proposed. With the use of the contact boundary conditions, complex copper patterns and dielectric layers are separately meshed and joined later. An experimental system is built for adjusting the thermal loading and verifying the simulation results. The numerical results are compared with experimental data to examine the validity of the method.
Keywords :
circuit simulation; copper; dielectric materials; electronics packaging; finite element analysis; printed circuit manufacture; thermoelasticity; contact boundary condition; copper pattern; cure kinetics; dielectric layer; finite element simulation; geometric modeling; nonlinear thermoelasticity problem; printed circuit board fabrication; printed circuit board patterning; thermal loading condition; warpage simulation; Computational modeling; Copper; Dielectrics; Load modeling; Solid modeling; Substrates; Temperature measurement; Contact boundary condition; printed circuit board; simulation; warpage;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2011.2114662
Filename :
5871427
Link To Document :
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