Title :
Temperature compensated sapphire-rutile microwave whispering gallery mode resonator
Author :
Kersalé, Y. ; Vallet, O. ; Vives, S. ; Meunier, C. ; Giordano, V.
Author_Institution :
Lab. de Phys. et Metrol. des Oscillateurs, CNRS, Besancon, France
fDate :
11/8/2001 12:00:00 AM
Abstract :
A 2 μm-thick film of rutile (TiO2) was deposited on a sapphire disk using a sol-gel method to realise a temperature compensated microwave resonator operating in whispering gallery mode configuration. The resonator, though not yet completely optimised, shows turnover temperatures ranging from 40 to 60 K depending on the mode azimutal number. For the WGH7,0,0 mode at 9.4 GHz, the Q-factor is of the order of 1.5×106 at 46 K. The technique appears easy to implement and can be used for the design of a high-frequency stability microwave source
Keywords :
Q-factor; compensation; dielectric resonators; frequency stability; microwave devices; sapphire; titanium compounds; 2 micron; 40 to 60 K; 9.4 GHz; Al2O3; Q-factor; TiO2-Al2O3; high-frequency stability microwave source; rutile film; sapphire disk; sapphire-rutile microwave resonator; sol-gel method; temperature compensated microwave resonator; whispering gallery mode resonator;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20010934
