DocumentCode :
1550632
Title :
Cavity length effects on internal loss and quantum efficiency of multiquantum-well lasers
Author :
Piprek, Joachim ; Abraham, Patrick ; Bowers, John E.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume :
5
Issue :
3
fYear :
1999
Firstpage :
643
Lastpage :
647
Abstract :
We investigate loss mechanisms in 1.55-μm InGaAsP-InP multiquantum-well ridge-waveguide laser diodes at room temperature. The common method of measuring light versus current curves and plotting the inverse slope efficiency versus laser length is employed to extract the internal optical loss αi and the differential internal efficiency η. This method neglects the dependence of both the parameters on the laser cavity length L. We analyze physical mechanisms behind these loss parameters and their length dependence using the commercial laser simulation software PICS3D. Internal optical losses are dominated by carrier density dependent absorption. The differential internal efficiency above threshold is found to be mainly restricted by carrier recombination losses within the quantum wells, i.e., Fermi level pinning is not observed. Both loss mechanisms are enhanced with shorter cavity length due to the higher quantum well carrier density. For the shortest device measured (L=269 μm), we extract αi=20 cm-1 and ηi=66%. With increasing cavity length, the loss parameters approach αi =15 cm-1 and ηi=70%. From the inverse slope efficiency versus cavity length plot, we obtain αi=14 cm-1 and ηi=67% independent of laser length
Keywords :
III-V semiconductors; electron-hole recombination; gallium arsenide; gallium compounds; indium compounds; laser beams; laser cavity resonators; optical loss measurement; quantum well lasers; ridge waveguides; waveguide lasers; 1.55 mum; 269 mum; 67 percent; 70 percent; Fermi level pinning; InGaAsP-InP; InGaAsP-InP multiquantum-well ridge-waveguide laser diodes; PICS3D software; carrier density dependent absorption; carrier recombination losses; cavity length; cavity length effects; commercial laser simulation software; differential internal efficiency; internal loss; internal optical loss; internal optical losses; inverse slope efficiency; laser cavity length; laser length; length dependence; light versus current curves; loss mechanisms; loss parameters; multiquantum-well lasers; physical mechanisms; quantum efficiency; quantum well carrier density; quantum wells; room temperature; Charge carrier density; Current measurement; Diode lasers; Laser theory; Length measurement; Loss measurement; Optical losses; Quantum well lasers; Temperature; Time of arrival estimation;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/2944.788430
Filename :
788430
Link To Document :
بازگشت