Title :
Refractive index reconstruction of graded-index buried channel waveguides from their mode intensities
Author :
Von Bibra, Mark L. ; Roberts, Ann
Author_Institution :
Sch. of Phys., Melbourne Univ., Parkville, Vic., Australia
fDate :
9/1/1997 12:00:00 AM
Abstract :
The refractive index distribution has been determined for a number of graded-index, single-mode, buried channel waveguides, formed by irradiation with a high energy focused ion beam. The refractive index has been calculated from the waveguide´s mode field intensity at a wavelength of 670 nm, via an inversion of the scalar wave equation. Waveguides with doses in the range 0.7×1015-4.1×1015 ions·cm-2 exhibited a peak refractive index change increasing linearly with ion dose, in the range 0.01-0.08%, and the results are consistent with profiles derived from TRIM simulations
Keywords :
gradient index optics; integrated optics; ion beam effects; optical fabrication; optical waveguide theory; optical waveguides; 670 nm; TRIM simulations; graded-index buried channel waveguides; graded-index single-mode buried channel waveguides; high energy focused ion beam; ion dose; irradiation; mode field intensity; mode intensities; peak refractive index change; profiles; refractive index; refractive index distribution; refractive index reconstruction; scalar wave equation; Ion beams; Optical devices; Optical refraction; Optical surface waves; Optical variables control; Optical waveguide theory; Optical waveguides; Particle beam optics; Refractive index; Surface topography;
Journal_Title :
Lightwave Technology, Journal of
