Refractive index reconstruction of graded-index buried channel waveguides from their mode intensities

Author

Von Bibra, Mark L. ; Roberts, Ann

Author_Institution

Sch. of Phys., Melbourne Univ., Parkville, Vic., Australia

Volume

15

Issue

9

fYear

1997

fDate

9/1/1997 12:00:00 AM

Firstpage

1695

Lastpage

1699

Abstract

The refractive index distribution has been determined for a number of graded-index, single-mode, buried channel waveguides, formed by irradiation with a high energy focused ion beam. The refractive index has been calculated from the waveguide´s mode field intensity at a wavelength of 670 nm, via an inversion of the scalar wave equation. Waveguides with doses in the range 0.7×10¹⁵-4.1×10¹⁵ ions·cm^-2 exhibited a peak refractive index change increasing linearly with ion dose, in the range 0.01-0.08%, and the results are consistent with profiles derived from TRIM simulations

Keywords

gradient index optics; integrated optics; ion beam effects; optical fabrication; optical waveguide theory; optical waveguides; 670 nm; TRIM simulations; graded-index buried channel waveguides; graded-index single-mode buried channel waveguides; high energy focused ion beam; ion dose; irradiation; mode field intensity; mode intensities; peak refractive index change; profiles; refractive index; refractive index distribution; refractive index reconstruction; scalar wave equation; Ion beams; Optical devices; Optical refraction; Optical surface waves; Optical variables control; Optical waveguide theory; Optical waveguides; Particle beam optics; Refractive index; Surface topography;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.622896

Filename

622896