Title :
Highly efficient laterally oxidized λ=950 nm InGaAs-AlGaAs single-mode lasers
Author :
Heerlein, Jörg ; Gruber, Stefan ; Grabherr, Martin ; Jäger, Roland ; Unger, Peter
Author_Institution :
Dept. of Optoelectron., Ulm Univ., Germany
Abstract :
Results on laser diodes operating in single lateral and longitudinal mode around an emission wavelength of 950 nm are reported. Index guiding and current confinement in these devices are provided by a laterally oxidized aperture. The effective refractive index step of the lateral waveguide can be adjusted by the position and the thickness of the aperture. Structures with different effective refractive index steps and various aperture widths (3-7 μm) have been characterized in CW operation at room temperature. Maximum output powers of 170 mW have been achieved. Due to the lower refractive index step compared to ridge-waveguide lasers, a larger lateral width of the optical waveguide can be chosen, preserving single-mode operation. Because of the low series resistance, wall-plug efficiencies up to 638 have been realized with these devices
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; infrared sources; laser modes; laser transitions; quantum well lasers; refractive index; 170 mW; 3 to 7 mum; 63 percent; 950 nm; CW operation; InGaAs SQW lasers; InGaAs-AlGaAs; InGaAs-AlGaAs single-mode lasers; aperture width; current confinement; effective refractive index step; effective refractive index steps; emission wavelength; highly efficient; index guiding; lateral waveguide; lateral width; laterally oxidized; laterally oxidized aperture; low series resistance; lower refractive index; optical waveguide; ridge-waveguide lasers; room temperature; single lateral mode; single-mode operation; wall-plug efficiencies; Apertures; Laser modes; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Semiconductor lasers; Surface emitting lasers; Vertical cavity surface emitting lasers; Waveguide lasers;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.788438