DocumentCode :
1550690
Title :
650-nm lasers with narrow far-field divergence with integrated optical mode expansion layers
Author :
Smowton, P.M. ; Lewis, G.M. ; Yin, M. ; Summers, H.D. ; Berry, G. ; Button, C.C.
Author_Institution :
Dept. of Phys. & Astron., Univ. of Wales Coll. of Cardiff, UK
Volume :
5
Issue :
3
fYear :
1999
Firstpage :
735
Lastpage :
739
Abstract :
By means of numerical simulation of the optical and electrical performance, we have designed 650-nm GaInP-AlGaInP quantum-well lasers with mode expansion layers which have a narrow vertical far-field divergence without sacrificing threshold current or threshold current temperature dependence. We have reduced the measured vertical far-field divergence in a 650-nm laser structure from 35° to 24° full-width at half-maximum without changing the threshold current, operating voltage, or threshold current temperature dependence. We have also calculated the tolerances in the thickness and composition necessary to realize this design in practice
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; integrated optics; laser beams; laser variables measurement; quantum well lasers; 650 nm; GaInP-AlGaInP; composition; design; electrical performance; full-width at half-maximum; integrated optical mode expansion layers; laser structure; mode expansion layers; narrow far-field divergence; narrow vertical far-field divergence; numerical simulation; operating voltage; optical performance; quantum-well lasers; thickness; threshold current; threshold current temperature dependence; tolerances; vertical far-field divergence; Integrated optics; Laser modes; Optical design; Optical refraction; Optical sensors; Optical variables control; Optical waveguides; Quantum well lasers; Threshold current; Waveguide lasers;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/2944.788444
Filename :
788444
Link To Document :
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