DocumentCode :
1550826
Title :
Uncooled low-cost thermal imager based on micromachined CMOS integrated sensor array
Author :
Schaufelbühl, Andri ; Schneeberger, N. ; Münch, Ulrich ; Waelti, Marc ; Paul, Oliver ; Brand, Oliver ; Baltes, Henry ; Menolfi, Christian ; Huang, Qiuting ; Doering, Elko ; Loepfe, Markus
Author_Institution :
Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Volume :
10
Issue :
4
fYear :
2001
fDate :
12/1/2001 12:00:00 AM
Firstpage :
503
Lastpage :
510
Abstract :
We present a micromachined 10×10 array of thermoelectric infrared sensors fabricated in a commercial complementary metal-oxide-semiconductor (CMOS) integrated circuit process with subsequent bulk-micromachining on wafer-scale. This array is used to demonstrate the feasibility of a low-cost thermal imager. The imager operates in ambient air, without thermal stabilization or cooling. The thermoelectric sensor principle allows one to measure dc radiation signals even without a radiation chopper. Each pixel contains an integrated heater, which allows calibration and self-testing of the imager. Addressing circuitry for the thermopiles and the heaters as well as a low-noise amplifier are integrated with the array on a single chip with a size of 5.5×6.2 mm. The imager achieves a temperature resolution of 530 mK with a low-cost polyethylene Fresnel lens. This performance allows application in presence detection, remote temperature measurement, and building control
Keywords :
CMOS image sensors; infrared detectors; infrared imaging; integrated optoelectronics; micromachining; microsensors; 5.5 mm; 6.2 mm; building control; bulk-micromachining; calibration; circuitry; cooling; dc radiation signals; heaters; low-cost polyethylene Fresnel lens; low-noise amplifier; micromachined CMOS integrated sensor array; presence detection; remote temperature measurement; self-testing; thermal stabilization; thermoelectric infrared sensors; thermopiles; uncooled low-cost thermal imager; wafer-scale; CMOS image sensors; CMOS integrated circuits; CMOS process; Cooling; Infrared sensors; Integrated circuit measurements; Semiconductor device measurement; Sensor arrays; Thermal sensors; Thermoelectricity;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.967372
Filename :
967372
Link To Document :
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