DocumentCode
155085
Title
Investigation of influence of different parameters on results of probe oxidation
Author
Pavlova, Anastasia Yu ; Khivintsev, Yu.V. ; Zaharov, A.A. ; Filimonov, Yu.A.
Author_Institution
Yuri Gagarin State Tech. Univ. of Saratov, Saratov, Russia
Volume
2
fYear
2014
fDate
25-26 Sept. 2014
Firstpage
457
Lastpage
460
Abstract
Fabrication of nanosized lines on magnetic films is of special interest because such lines can be used as nanosized elements for fabrication of planar tunnel junctions [1] or periodic planar structures that can serve as surface phononic crystal (SPC) for hypersonic frequency range that could be controlled by magnetic field [2]. Probe oxidation is one of the perspective tools to create such nanostructures. It is based on the electrochemical reaction of oxidation in the water meniscus under the sharp tip of the atomic force microscope (AFM). The reaction is stimulated by applied voltage between the tip and the sample [3]. There are only few works on probe oxidation of Ni [1, 4-5] and FeCo films [5]. But there is no investigation on influence of wide range of parameters on oxidation results. In this work investigation of dependences of probe oxidation of ferromagnetic metal films Ni and FeCo on different probe oxidation parameters is presented. Definition of optimal process parameters for fabrication structures with certain sizes was done.
Keywords
atomic force microscopy; cobalt alloys; ferromagnetic materials; iron alloys; magnetic thin films; nanofabrication; nanostructured materials; nickel; oxidation; phononic crystals; AFM; FeCo; FeCo films; Ni; Ni films; SPC; applied voltage; atomic force microscopy; electrochemical reaction; ferromagnetic metal films; hypersonic frequency range; magnetic field; magnetic films; nanosized elements; nanosized line fabrication; optimal process parameters; periodic planar structures; planar tunnel junctions; probe oxidation parameters; probe oxidation results; surface phononic crystal; water meniscus oxidation; Fabrication; Films; Humidity; Microscopy; Nickel; Oxidation; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering (APEDE), 2014 International Conference on
Conference_Location
Saratov
Print_ISBN
978-1-4799-3437-9
Type
conf
DOI
10.1109/APEDE.2014.6958293
Filename
6958293
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