• DocumentCode
    1551011
  • Title

    Linewidth measurements and phase locking of Josephson oscillators using RSFQ circuits

  • Author

    Dubash, N.B. ; Yongming Zhang ; Ghoshal, U. ; Perng-Fei Yuh

  • Author_Institution
    Conductus Inc., Sunnyvale, CA, USA
  • Volume
    7
  • Issue
    3
  • fYear
    1997
  • Firstpage
    3808
  • Lastpage
    3811
  • Abstract
    We present a technique for linewidth measurement and phase-locking of Josephson oscillators using digital rapid single-flux-quantum (RSFQ) circuits. The oscillator consists of a resistively shunted 6 /spl mu/m/spl times/6 /spl mu/m Nb/AlO/sub x//Nb Josephson tunnel junction that is integrated with RSFQ input and output circuits. A cascade of RSFQ T flip-flops is used to directly monitor the output of the Josephson oscillator. Spectral characteristics have been measured directly for oscillator frequencies ranging from 10-50 GHz. The linewidth can be reduced by over 100 times by phase-locking the oscillator to an RSFQ pulse train generated by an external sinusoidal signal. These Josephson oscillators can be used as on-chip stable high frequency clocks for RSFQ circuits.
  • Keywords
    clocks; flip-flops; integrated circuit measurement; microwave measurement; microwave oscillators; millimetre wave measurement; millimetre wave oscillators; phase locked oscillators; superconducting device testing; superconducting integrated circuits; superconducting logic circuits; superconducting microwave devices; 10 to 50 GHz; Josephson oscillators; Nb-AlO-Nb; RSFQ T flip-flops; RSFQ circuits; RSFQ pulse train; digital rapid single-flux-quantum circuits; linewidth measurement; on-chip stable high frequency clocks; oscillator frequencies; phase locking; resistively shunted Nb/AlO/sub x//Nb Josephson tunnel junction; spectral characteristics; Clocks; Flip-flops; Frequency measurement; Integrated circuit measurements; Monitoring; Niobium; Oscillators; Phase measurement; Pulse generation; Signal generators;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.622979
  • Filename
    622979