DocumentCode
1551292
Title
Structural and optical characterisation of holey fibres using scanning probe microscopy
Author
Hiliman, C.W.J. ; Brocklesby, W.S. ; Monro, T.M. ; Belardi, W. ; Richardson, D.J.
Author_Institution
Optoelectron. Res. Centre, Southampton Univ., UK
Volume
37
Issue
21
fYear
2001
fDate
10/11/2001 12:00:00 AM
Firstpage
1283
Lastpage
1284
Abstract
An investigation of a holey fibre using scanning probe microscopy techniques, which the authors believe is the first such investigation, is presented. Atomic force microscopy images provide knowledge of the fibre structure without the artefacts associated with scanning electron microscopy imaging. A tapered fibre scanning near-field optical microscopy probe has been used to investigate holey fibre modes at 785 nm
Keywords
atomic force microscopy; near-field scanning optical microscopy; optical fibres; 785 nm; atomic force microscopy; holey fibre; optical characteristics; scanning probe microscopy; structural characteristics; tapered fibre scanning near-field optical microscopy probe;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20010874
Filename
968434
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