• DocumentCode
    1551292
  • Title

    Structural and optical characterisation of holey fibres using scanning probe microscopy

  • Author

    Hiliman, C.W.J. ; Brocklesby, W.S. ; Monro, T.M. ; Belardi, W. ; Richardson, D.J.

  • Author_Institution
    Optoelectron. Res. Centre, Southampton Univ., UK
  • Volume
    37
  • Issue
    21
  • fYear
    2001
  • fDate
    10/11/2001 12:00:00 AM
  • Firstpage
    1283
  • Lastpage
    1284
  • Abstract
    An investigation of a holey fibre using scanning probe microscopy techniques, which the authors believe is the first such investigation, is presented. Atomic force microscopy images provide knowledge of the fibre structure without the artefacts associated with scanning electron microscopy imaging. A tapered fibre scanning near-field optical microscopy probe has been used to investigate holey fibre modes at 785 nm
  • Keywords
    atomic force microscopy; near-field scanning optical microscopy; optical fibres; 785 nm; atomic force microscopy; holey fibre; optical characteristics; scanning probe microscopy; structural characteristics; tapered fibre scanning near-field optical microscopy probe;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20010874
  • Filename
    968434