Title :
Quasi-static analysis of coupled microstrip lines with asymmetrical finite metallization thickness
Author :
Hong, Ic-Pyo ; Park, Seong-Kyoon ; Park, Han-Kyu
Author_Institution :
Dept. of Radio Commun. Eng., Yonsei Univ., Seoul, South Korea
fDate :
9/1/1999 12:00:00 AM
Abstract :
This paper describes the quasi-static analysis of coupled microstrip lines with asymmetrical finite metallization thickness. A generalized mode-matching method extended from the conventional mode-matching method has been used to analyze the inhomogeneous structure with arbitrary metallization thickness and is validated through comparison with those from other available results. This method cannot only provide a simple approach to the quasi-static analysis of the inhomogeneous structures with arbitrary metallization thickness, but can also be applied to analyze the effect of metal penetration depth into the substrate. The results show that the asymmetrical finite metallization thickness and metal penetration depth into the substrate can be newly added to the quasi-static design parameters of coupled microstrip lines
Keywords :
MMIC; coupled transmission lines; integrated circuit metallisation; microstrip lines; mode matching; transmission line theory; arbitrary metallization thickness; asymmetrical finite metallization thickness; coupled microstrip lines; generalized mode-matching method; inhomogeneous structure; metal penetration depth; quasi-static analysis; quasi-static design parameters; substrate penetration; Coordinate measuring machines; Coupling circuits; Eigenvalues and eigenfunctions; Frequency; Metallization; Microstrip; Microwave propagation; Mode matching methods; Planar transmission lines; Radio communication;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
