DocumentCode :
155135
Title :
Properties of complex parameters of five-port reflectometer with E-plane T-junctions
Author :
Andreev, Mikhail V. ; Borulko, V.F. ; Karlov, V.A.
Author_Institution :
Dept. of Phys., Oles Honchar Dnipropetrovsk Nat. Univ., Dnipropetrovsk, Ukraine
fYear :
2014
fDate :
22-25 Sept. 2014
Firstpage :
132
Lastpage :
134
Abstract :
The problem of creating meter of complex reflection coefficient based on the electromagnetic approach using E-plane dividers is studied. Rigorous electromagnetic model of direct and inverse problems of five-port measurements of complex reflection coefficient is derived. Frequency dependencies of model parameters are calculated. Properties of T-junctions are investigated.
Keywords :
electromagnetic wave reflection; inverse problems; reflectometers; E-plane T-junctions; E-plane dividers; complex parameters; complex reflection coefficient; five-port measurements; five-port reflectometer; inverse problems; rigorous electromagnetic model; Antenna measurements; Electromagnetic scattering; Electromagnetic waveguides; Electromagnetics; Mathematical model; Reflection coefficient; Transmission line measurements; complex reflection coefficient; multiport waveguide discontinuity; six-port;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED), 2014 XIXth International Seminar/Workshop on
Conference_Location :
Tbilisi
Print_ISBN :
978-1-4799-6213-6
Type :
conf
DOI :
10.1109/DIPED.2014.6958346
Filename :
6958346
Link To Document :
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