DocumentCode :
1551520
Title :
Stable Encapsulated Organic TFT With a Spin-Coated Poly(4-Vinylphenol-Co-Methyl Methacrylate) Dielectric
Author :
Zan, Hsiao-Wen ; Hsu, Ting-Yu
Author_Institution :
Dept. of Photonics, Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
32
Issue :
8
fYear :
2011
Firstpage :
1131
Lastpage :
1133
Abstract :
The influences of encapsulation on the hysteresis and the gate-bias-stress effects (both positive and negative gate bias stresses) of pentacene organic thin-film transistors (OTFTs) with poly(4-vinylphenol) and poly(4-vinylphenol-co-methyl methacrylate) (PVP-PMMA) gate dielectrics are investigated. The encapsulation and the use of less polar gate dielectrics like PVP-PMMA copolymers are both important to suppress moisture adsorption and to obtain a stable pentacene OTFT. Compared to the air-stable OTFT with a fluoropolymer dielectric, the stable encapsulated OTFT with a PVP-PMMA dielectric is a low-cost promising candidate for mass production consideration.
Keywords :
polymer blends; thin film transistors; PVP-PMMA copolymers; air-stable pentacene organic thin-film transistors; encapsulated organic TFT stability; fluoropolymer dielectric; mass production consideration; moisture adsorption suppression; negative gate bias stresses; positive gate bias stresses; spin-coated poly 4-vinylphenol-co-methyl methacrylate gate dielectrics; Dielectrics; Hysteresis; Logic gates; Organic thin film transistors; Pentacene; Stress; Bias stress; pentacene; poly(4-vinylphenol-co-methyl methacrylate) (PVP-PMMA); reliability; thin-film transistor;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2155026
Filename :
5872005
Link To Document :
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