Title :
Modeling Non-Quasi-Static Effects in SiGe HBTs Using Improved Charge Partitioning Scheme
Author :
Augustine, Noel ; Kumar, Khamesh ; Bhattacharyya, Arkaprava ; Zimmer, Thomas ; Chakravorty, Anjan
Author_Institution :
Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India
Abstract :
The applicability of a partitioned-charge-based non-quasi-static (NQS) model is investigated using exact solutions for 1-D bipolar transistors. Limitations of the model to accurately predict
are overcome by further delaying the partitioned minority charge associated with the collector. A corresponding small-signal time-domain model is derived. The proposed model effectively includes the delays within both the quasi-neutral base and base–collector space-charge regions. Using only two extra nodes over the quasi-static bipolar transistor model HICUM, the NQS model is implemented using Verilog-A. The simplicity of the model yields straightforward parameter extraction techniques. Modeling results show excellent agreement with numerically simulated data.
Keywords :
Accuracy; Bipolar transistors; Delay; Integrated circuit modeling; Numerical models; Silicon germanium; Thyristors; Base–collector space-charge region (BC SCR) delay; charge partitioning; non-quasi-static (NQS) effects; quasi-neutral base (QNB) delay; silicon germanium heterojunction bipolar transistor (SiGe HBT); subcircuit model;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2012.2202236