• DocumentCode
    1551567
  • Title

    Modeling Non-Quasi-Static Effects in SiGe HBTs Using Improved Charge Partitioning Scheme

  • Author

    Augustine, Noel ; Kumar, Khamesh ; Bhattacharyya, Arkaprava ; Zimmer, Thomas ; Chakravorty, Anjan

  • Author_Institution
    Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India
  • Volume
    59
  • Issue
    9
  • fYear
    2012
  • Firstpage
    2542
  • Lastpage
    2545
  • Abstract
    The applicability of a partitioned-charge-based non-quasi-static (NQS) model is investigated using exact solutions for 1-D bipolar transistors. Limitations of the model to accurately predict y_{21}(\\omega ) are overcome by further delaying the partitioned minority charge associated with the collector. A corresponding small-signal time-domain model is derived. The proposed model effectively includes the delays within both the quasi-neutral base and base–collector space-charge regions. Using only two extra nodes over the quasi-static bipolar transistor model HICUM, the NQS model is implemented using Verilog-A. The simplicity of the model yields straightforward parameter extraction techniques. Modeling results show excellent agreement with numerically simulated data.
  • Keywords
    Accuracy; Bipolar transistors; Delay; Integrated circuit modeling; Numerical models; Silicon germanium; Thyristors; Base–collector space-charge region (BC SCR) delay; charge partitioning; non-quasi-static (NQS) effects; quasi-neutral base (QNB) delay; silicon germanium heterojunction bipolar transistor (SiGe HBT); subcircuit model;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2202236
  • Filename
    6230645