Title :
Simulated fault injection: a methodology to evaluate fault tolerant microprocessor architectures
Author :
Choi, Gwan S. ; Iyer, Ravishankar K. ; Carreno, Victor A.
Author_Institution :
Illinois Univ., Urbana-Champaign, IL, USA
fDate :
10/1/1990 12:00:00 AM
Abstract :
A simulation-based fault-injection methodology for validating fault-tolerant microprocessor architectures is described. The approach uses mixed-mode simulation (electrical/logic analysis), and injects transient errors in run-time to assess the resulting fault-impact. To exemplify the methodology, a fault-tolerant architecture which models the digital aspects of a dual-channel, real-time jet-engine controller is used. The level of effectiveness of the dual configuration with respect to single and multiple transients is measured. The results indicate 100% coverage of single transients. Approximately 12% of the multiple transients affect both channels; none result in controller failure since two additional levels of redundancy exist
Keywords :
computer testing; development systems; fault tolerant computing; redundancy; virtual machines; controller failure; fault tolerant microprocessor architectures; fault-tolerant architecture; mixed-mode simulation; real-time jet-engine controller; redundancy; simulation-based fault-injection methodology; Aerospace electronics; Analytical models; Communication system control; Computational modeling; Digital systems; Fault tolerance; Logic devices; Microprocessors; NASA; Transient analysis;
Journal_Title :
Reliability, IEEE Transactions on