• DocumentCode
    1551918
  • Title

    Evaluation and design of an ultra-reliable distributed architecture for fault tolerance

  • Author

    Walter, Chris J.

  • Author_Institution
    Allied-Signal Aerosp. Technol. Center, Columbia, MD, USA
  • Volume
    39
  • Issue
    4
  • fYear
    1990
  • fDate
    10/1/1990 12:00:00 AM
  • Firstpage
    492
  • Lastpage
    499
  • Abstract
    The issues related to the experimental evaluation of an early conceptual prototype of the MAFT (multicomputer architecture for fault tolerance) architecture are discussed. A completely automated testing approach was designed to allow fault-injection experiments to be performed, including stuck-at and memory faults. Over 2000 injection tests were run and the system successfully tolerated all faults. Concurrent with the experimental evaluation, an analytic evaluation was carried out to determine if higher levels of reliability could be achieved. The lessons learned in the evaluation phase culminated in a new design of the MAFT architecture for applications needing ultrareliability. The design uses the concept of redundantly self-checking functions to address the rigid requirements proposed for a future generation of mission-critical avionics. The testing of three subsystems critical to the operation of the new MAFT is presented with close to 50-k test cycles performed over 51 different IC devices to verify the designs
  • Keywords
    automatic testing; computer testing; distributed processing; fault tolerant computing; IC devices; MAFT; automated testing; fault tolerance; fault-injection experiments; memory faults; mission-critical avionics; redundantly self-checking functions; stuck at faults; ultra-reliable distributed architecture; Communication system control; Fault tolerance; Fault tolerant systems; Integrated circuit testing; Performance evaluation; Probability; Processor scheduling; Prototypes; Redundancy; System testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.58727
  • Filename
    58727