DocumentCode :
1552380
Title :
A unified approach for calculating error rates of linearly modulated signals over generalized fading channels
Author :
Alouini, Mohamed-Slim ; Goldsmith, Andrea J.
Author_Institution :
Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
Volume :
47
Issue :
9
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
1324
Lastpage :
1334
Abstract :
We present a unified analytical framework to determine the exact average symbol-error rate (SER) of linearly modulated signals over generalized fading channels. The results are applicable to systems employing coherent demodulation with maximal-ratio combining multichannel reception. The analyses assume independent fading paths, which are not necessarily identically distributed. In all cases, the proposed approach leads to an expression of the average SER involving a single finite-range integral, which can be easily computed numerically. In addition, as special cases, SER expressions for single-channel reception are obtained. These expressions reduce to well-known solutions, give alternative (often simpler) expressions for previous results, or provide new formulas that are either closed-form expressions or simple to compute numerically
Keywords :
amplitude modulation; demodulation; error statistics; fading channels; integral equations; multipath channels; phase shift keying; BER; M-PSK; M-ary amplitude modulation; average SER; closed-form expressions; coherent demodulation; diversity reception; error rates; exact average symbol-error rate; finite-range integral; generalized fading channels; independent fading paths; linearly modulated signals; maximal-ratio combining multichannel reception; multipath fading channel; single-channel reception; square M-ary amplitude modulation; unified approach; AWGN; Additive white noise; Closed-form solution; Demodulation; Diversity reception; Error analysis; Fading; Phase shift keying; Rayleigh channels; Signal analysis;
fLanguage :
English
Journal_Title :
Communications, IEEE Transactions on
Publisher :
ieee
ISSN :
0090-6778
Type :
jour
DOI :
10.1109/26.789668
Filename :
789668
Link To Document :
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