DocumentCode :
1552487
Title :
Vertical mirrors fabricated by deep reactive ion etching for fiber-optic switching applications
Author :
Marxer, Cornel ; Thio, Christian ; Grétillat, Marc-Alexia ; De Rooij, Nicolaas F. ; Bättig, Rainer ; Anthamatten, Oliver ; Valk, Bernd ; Vogel, Paul
Author_Institution :
Inst. of Microtechnol., Neuchatel Univ., Switzerland
Volume :
6
Issue :
3
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
277
Lastpage :
285
Abstract :
We report on vertical mirrors fabricated by deep reactive ion etching of silicon. The mirror height is 75 μm, covering the fiber core of a single-mode fiber when the latter is placed into a groove of equal depth and etched simultaneously with the mirror. To obtain a uniform etch depth, etching is stopped on a buried oxide layer. Using the buried oxide as a sacrificial layer allows to fabricate mirrors with suspension and actuation structures as well as fiber-alignment grooves in one and the same processing step. A minimal mirror thickness of 2.3 μm was achieved, resulting in an aspect ratio higher than 30. The verticality was better than 89.3°. In the upper part of the mirror a surface roughness below 40 nm rms was obtained. At a wavelength of 1300 nm the reflectivity of the aluminum-coated mirrors was measured to be higher than 76%. Using a reactive ion etched mirror we have fabricated an optical fiber switch with electrostatic actuation. The coupling loss in the bar state of two packaged prototypes was between 0.6 and 1.7 dB and between 1.4 and 3.4 dB in the cross state. The switching time is below 0.2 ms
Keywords :
mirrors; optical fabrication; optical fibres; optical switches; sputter etching; Al; Si; alignment groove; aluminum coating; aspect ratio; buried oxide layer; coupling loss; deep reactive ion etching; electrostatic actuation; fabrication; micromirror; optical fiber switch; reflectivity; silicon; surface roughness; suspension; vertical mirror; Electrostatic measurements; Etching; Mirrors; Optical fibers; Optical surface waves; Reflectivity; Rough surfaces; Silicon; Surface roughness; Wavelength measurement;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.623118
Filename :
623118
Link To Document :
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