DocumentCode :
1552765
Title :
The advantages of triangular and tetrahedral edge elements for electromagnetic modeling with the finite-element method
Author :
Wu, Jo-Yu ; Lee, Robert
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
45
Issue :
9
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
1431
Lastpage :
1437
Abstract :
In this paper, we examine the numerical dispersion properties of the tetrahedral edge element in comparison to other edge and nodal elements. For all nodal elements as well as hexahedral edge elements, the phase error is always either positive or negative for waves propagating at any incidence angle, which means that the error accumulates as the wave propagates from element to element. This effect can produce large errors for electrically large geometries. On the other hand, the tetrahedral edge elements can produce either a negative or positive phase error, depending on the direction of propagation through the element. For an unstructured mesh, phase cancellation occurs since the orientation of the tetrahedral elements are arbitrary. Because of the cancellation, the numerical dispersion error is very low for meshes composed of well-shaped tetrahedral edge elements. Numerical results are presented to demonstrate this point
Keywords :
electromagnetic field theory; electromagnetic wave propagation; error analysis; finite element analysis; mesh generation; waveguide theory; electrically large geometries; electromagnetic modeling; electromagnetic wave propagation; finite-element method; hexahedral edge elements; negative phase error; nodal elements; numerical dispersion properties; numerical results; phase cancellation; phase error; positive phase error; tetrahedral edge elements; triangular edge elements; unstructured mesh; Conductors; Electromagnetic modeling; Electromagnetic scattering; Finite element methods; Geometry; Helium; Resonant frequency; Shape; Solid modeling; Two dimensional displays;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.623133
Filename :
623133
Link To Document :
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