Title :
Roadmaps and visions for design and test
Author :
Joyner, William H., Jr. ; Kahng, Andrew B.
Author_Institution :
University of California
Keywords :
Algorithm design and analysis; Circuit testing; Computer science; Costs; Electronic design automation and methodology; Electronics industry; Mathematics; Semiconductor device testing; Software design; Transistors;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2001.970414
