DocumentCode

1553040

Title

The design and test cost problem

Author

Maly, Wojciech

Author_Institution

Carnegie Mellon University

Volume

18

Issue

6

fYear

2001

Firstpage

6

Lastpage

6

Keywords

Algorithm design and analysis; Costs; Integrated circuit testing; Logic design; Logic gates; Maxwell equations; Silicon; System testing; System-on-a-chip; Timing;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.2001.970415

Filename

970415