• DocumentCode
    1553046
  • Title

    80 Gbit/s optoelectronic delayed flip-flop circuit using resonant tunnelling diodes and uni-travelling-carrier photodiode

  • Author

    Sano, K. ; Murata, K. ; Otsuji, T. ; Akeyoshi, T. ; Shimizu, N. ; Sano, E.

  • Author_Institution
    NTT Network Innovation Labs., Kanagawa, Japan
  • Volume
    35
  • Issue
    16
  • fYear
    1999
  • fDate
    8/5/1999 12:00:00 AM
  • Firstpage
    1376
  • Lastpage
    1377
  • Abstract
    An 80 Gbit/s optoelectronic delayed flip-flop circuit which uses resonant tunnelling diodes and a uni-travelling-carrier photodiode is reported. The circuit design, which suppresses the effect of the AC current in the RTD pair, is the key to achieving such high-speed flip-flop operation. The monolithically fabricated circuit successfully operates at 80 Gbit/s while consuming 7.68 mW, and is the fastest flip-flop circuit ever reported
  • Keywords
    delays; flip-flops; integrated optoelectronics; photodiodes; resonant tunnelling diodes; 7.68 mW; 80 Gbit/s; high-speed flip-flop circuit; monolithic integration; optoelectronic delay; resonant tunnelling diode; uni-travelling-carrier photodiode;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19990944
  • Filename
    790063