DocumentCode :
1553046
Title :
80 Gbit/s optoelectronic delayed flip-flop circuit using resonant tunnelling diodes and uni-travelling-carrier photodiode
Author :
Sano, K. ; Murata, K. ; Otsuji, T. ; Akeyoshi, T. ; Shimizu, N. ; Sano, E.
Author_Institution :
NTT Network Innovation Labs., Kanagawa, Japan
Volume :
35
Issue :
16
fYear :
1999
fDate :
8/5/1999 12:00:00 AM
Firstpage :
1376
Lastpage :
1377
Abstract :
An 80 Gbit/s optoelectronic delayed flip-flop circuit which uses resonant tunnelling diodes and a uni-travelling-carrier photodiode is reported. The circuit design, which suppresses the effect of the AC current in the RTD pair, is the key to achieving such high-speed flip-flop operation. The monolithically fabricated circuit successfully operates at 80 Gbit/s while consuming 7.68 mW, and is the fastest flip-flop circuit ever reported
Keywords :
delays; flip-flops; integrated optoelectronics; photodiodes; resonant tunnelling diodes; 7.68 mW; 80 Gbit/s; high-speed flip-flop circuit; monolithic integration; optoelectronic delay; resonant tunnelling diode; uni-travelling-carrier photodiode;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19990944
Filename :
790063
Link To Document :
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