DocumentCode

1553080

Title

Debugging using resublimated thiotimoline

Author

Davidson, Scott

Author_Institution

Sun Microsystems

Volume

18

Issue

6

fYear

2001

Firstpage

80

Lastpage

80

Keywords

Chemistry; Circuit testing; Clocks; Debugging; Delay; Microprocessors; Registers; Silicon; Sun; System testing;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.2001.970426

Filename

970426