DocumentCode :
1553080
Title :
Debugging using resublimated thiotimoline
Author :
Davidson, Scott
Author_Institution :
Sun Microsystems
Volume :
18
Issue :
6
fYear :
2001
Firstpage :
80
Lastpage :
80
Keywords :
Chemistry; Circuit testing; Clocks; Debugging; Delay; Microprocessors; Registers; Silicon; Sun; System testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2001.970426
Filename :
970426
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1553080
