DocumentCode :
1553221
Title :
Line-based recognition using a multidimensional Hausdorff distance
Author :
Yi, Xilin ; Camps, Octavia I.
Author_Institution :
ENSCO Inc., Springfield, VA, USA
Volume :
21
Issue :
9
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
901
Lastpage :
916
Abstract :
A line-feature-based approach for model based recognition using a four-dimensional Hausdorff distance is proposed. This approach reduces the problem of finding the rotation, scaling, and translation transformations between a model and an image to the problem of finding a single translation minimizing the Hausdorff distance between two sets of points in a four-dimensional space. The implementation of the proposed algorithm can be naturally extended to higher dimensional spaces to efficiently find correspondences between n-dimensional patterns. The method performance and sensitivity to segmentation problems are quantitatively characterized using an experimental protocol with simulated data. It is shown that the algorithm performs well, is robust to occlusion and outliers, and that it degrades nicely as the segmentation problems increase. Experiments with real images are also presented
Keywords :
image matching; image segmentation; transforms; four-dimensional Hausdorff distance; four-dimensional space; line-based recognition; line-feature-based approach; model based recognition; multidimensional Hausdorff distance; n-dimensional patterns; segmentation problems; Degradation; Engineering drawings; Helium; Image edge detection; Image recognition; Image segmentation; Layout; Multidimensional systems; Protocols; Robustness;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.790430
Filename :
790430
Link To Document :
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