Title :
View-based recognition using an eigenspace approximation to the Hausdorff measure
Author :
Huttenlocher, Daniel P. ; Lilien, Ryan H. ; Olson, Clark F.
Author_Institution :
Dept. of Comput. Sci., Cornell Univ., Ithaca, NY, USA
fDate :
9/1/1999 12:00:00 AM
Abstract :
View-based recognition methods, such as those using eigenspace techniques, have been successful for a number of recognition tasks. Such approaches, however, are somewhat limited in their ability to recognize objects that are partly hidden from view or occur against cluttered backgrounds. In order to address these limitations, we have developed a view matching technique based on an eigenspace approximation to the generalized Hausdorff measure. This method achieves compact storage and fast indexing that are the main advantages of eigenspace view matching techniques, while also being tolerant of partial occlusion and background clutter. The method applies to binary feature maps, such as intensity edges, rather than directly to intensity images
Keywords :
eigenvalues and eigenfunctions; image matching; object recognition; Hausdorff measure; binary feature maps; cluttered backgrounds; compact storage; eigenspace approximation; fast indexing; intensity edges; partial occlusion; view matching technique; view-based recognition; Digital images; Feature extraction; Image matching; Image recognition; Indexing; Laplace equations; Q measurement; Robustness; Search engines; Size measurement;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on