• DocumentCode
    1553349
  • Title

    Comparison of optical VCSEL models on the simulation of oxide-confined devices

  • Author

    Bienstman, Peter ; Baets, Roel ; Vukusic, Josip ; Larsson, Anders ; Noble, Michael J. ; Brunner, Marcel ; Gulden, Karlheinz ; Debernardi, Pierluigi ; Fratta, Laura ; Bava, Gian Paolo ; Wenzel, Hans ; Klein, Benjamin ; Conradi, Olaf ; Pregla, Reinhold ; Ri

  • Author_Institution
    Dept. of Inf. Technol., Ghent Univ., Belgium
  • Volume
    37
  • Issue
    12
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1618
  • Lastpage
    1631
  • Abstract
    We compare the results of different optical vertical-cavity surface-emitting laser models on the position-dependent effects of thin oxide apertures. Both scalar and vectorial models as well as hybrid models are considered. Physical quantities that are compared are resonance wavelength, threshold material gain, and modal stability. For large device diameters and low-order modes, the agreement between the different models is quite good. Larger differences occur when considering smaller devices and higher order modes. It is also observed that the spread in the resonance wavelengths is smaller than that for the threshold material gain
  • Keywords
    distributed Bragg reflector lasers; laser modes; semiconductor device models; semiconductor lasers; stability; surface emitting lasers; vectors; higher order modes; hybrid models; low-order modes; modal stability; optical VCSEL models; optical vertical cavity surface-emitting laser models; oxide-confined device; position-dependent effects; resonance wavelength; resonance wavelengths; scalar models; thin oxide apertures; threshold material gain; vectorial models; Apertures; Laser modes; Optical devices; Optical interconnections; Optical sensors; Optical surface waves; Resonance; Semiconductor lasers; Surface emitting lasers; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.970909
  • Filename
    970909