Title :
Implementation and calibration of a two-port electrooptic network analyzer
Author :
Elamaran, Balasundaram ; Pollard, Roger D. ; Iezekiel, Stavros
Author_Institution :
Sch. of Electron. & Electr. Eng., Leeds Univ., UK
fDate :
9/1/1999 12:00:00 AM
Abstract :
A novel bidirectional electrooptic network analyzer has been demonstrated which enables the full S-parameter characterization of both electrooptic (E/O) and optoelectronic (O/E) components using a single connection of the device-under-test to the test ports. A combined two-tier E/O and O/E calibration is proposed. Measurement results which validate both the analyzer architecture and the calibration are presented
Keywords :
S-parameters; calibration; electro-optical devices; network analysers; optical testing; optoelectronic devices; S-parameter characterization; analyzer architecture; bidirectional network analyzer; calibration; optoelectronic components; two-port electrooptic network analyzer; Calibration; Diode lasers; Directional couplers; Electrooptic devices; Optical coupling; Optical devices; Optical fiber networks; Optical modulation; Photodiodes; Testing;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
