DocumentCode
1553504
Title
Temperature-Aware Architecture: Lessons and Opportunities
Author
Wei Huang ; Allen-Ware, M. ; Carter, J.B. ; Cheng, Eddie ; Skadron, Kevin ; Stan, M.R.
Volume
31
Issue
3
fYear
2011
Firstpage
82
Lastpage
86
Abstract
Managing temperature has become an important concern in modern processor and other microelectronic chips. The problem has become especially severe as the ability to reduce supply voltage has slowed. As a result, the number of devices per unit area is sca ing up faster than the power density is scaling down. This requires more expensive cooling solutions to keep the chip and its local hotspots cool, and these challenges will be exacerbated by 3D integration, which seems imminent. Furthermore, high temperature slows integrated circuits because of degraded carrier mobility and interconnect resistivity. It also accelerates multiple chip-failure mechanisms such as electromigration and negative bias temperature instability (NBTI), because the wearout rate has an exponential temperature dependency. Static leakage power is primarily an exponential function of temperature. There´s also the possibility of thermally induced security vulnerabilities, such as denial of service. Unfortunately, air cooling´s ability to address temperature concerns is limited by system-level power constraints, acoustic challenges, and sometimes form factors, while alternative cooling solutions are still too expensive for commodity use. Temperature-aware design can reduce these problems.
Keywords
microprocessor chips; power aware computing; chip-failure mechanism; denial of service; electromigration mechanism; microelectronic chips; negative bias temperature instability mechanism; power density; processor chips; static leakage power; temperature management; temperature-aware architecture; temperature-aware design; wearout rate; Atmospheric modeling; Cooling; Electronic packaging thermal management; Servers; Silicon; Temperature sensors; Thermal management; Temperature-aware design; cooling solution; heat transfer; hotspots; server system; temperature sensors; thermal model;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/MM.2011.60
Filename
5875958
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