DocumentCode
1553628
Title
A General Framework to Perform the MAX/MIN Operations in Parameterized Statistical Timing Analysis Using Information Theoretic Concepts
Author
Rubanov, Nikolay
Author_Institution
Magma Design Autom., San Jose, CA, USA
Volume
30
Issue
7
fYear
2011
fDate
7/1/2011 12:00:00 AM
Firstpage
1011
Lastpage
1019
Abstract
As integrated circuit technologies are scaled down to the nanometer regime, process variations have increasing impact on circuit timing. To address this issue, parameterized statistical static timing analysis (SSTA) has been recently developed. In parameterized SSTA, process variations are represented as random variables (RVs) and timing quantities (delays and others) are expressed as functions of these variables. Most of the existing algorithms to compute the MAX/MIN operations in parameterized SSTA model spatial and path-based statistical dependencies of variation sources using the second-order statistical methods. Unfortunately, such methods have limited capabilities to determine statistical relations between RVs. This results in decreasing the accuracy of the MAX/MIN algorithms, especially when process parameters follow non-Gaussian probability density functions (PDFs) and/or affect timing quantities nonlinearly. In contrast, information theory (IT) provides powerful techniques that allow a natural PDF-based analysis of probabilistic relations between RVs. So, in this paper, we propose a new framework to perform the MAX/MIN operations based on IT concepts. The key ideas behind our framework are: 1) exploiting information entropy to measure unconditional equivalence between an actual MAX/MIN output and its approximate parameterized representation, and 2) using mutual information to measure equivalence of actual and parameterized MAX/MIN outputs from the viewpoint of their statistical relations to process variations. We construct a general IT-based MAX/MIN algorithm that allows a number of particular realizations accounting for statistical properties of parameterized RVs. The experimental results validate the correctness and demonstrate a high accuracy of the new IT-based approach to compute the MAX/MIN.
Keywords
circuit CAD; entropy; integrated circuit design; nanoelectronics; probability; random processes; timing circuits; IT-based MAX/MIN algorithm; MAX/MIN operation; PDF-based analysis; circuit timing; information entropy; information theory; integrated circuit technology; nanometer regime; nonGaussian probability density function; parameterized SSTA model; parameterized statistical static timing analysis; path-based statistical dependency; probabilistic relation; process parameter; process variation; random variable; second-order statistical method; statistical property; timing quantity; unconditional equivalence; Algorithm design and analysis; Approximation algorithms; Approximation methods; Entropy; Probabilistic logic; Sensitivity; Timing; Information theoretic concepts; statistical timing analysis; the MAX/MIN operations;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2011.2113610
Filename
5875992
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