BIST-Based Fault Diagnosis for Read-Only Memories

Author

Mukherjee, Nilanjan ; Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy

Author_Institution

Mentor Graphics Corp., Wilsonville, OR, USA

Volume

30

Issue

7

fYear

2011

fDate

7/1/2011 12:00:00 AM

Firstpage

1072

Lastpage

1085

Abstract

This paper presents a built-in self-test (BIST)-based scheme for fault diagnosis that can be used to identify permanent failures in embedded read-only memories. The proposed approach offers a simple test flow and does not require intensive interactions between a BIST controller and a tester. The scheme rests on partitioning of rows and columns of the memory array by employing low cost test logic. It is designed to meet requirements of at-speed test thus enabling detection of timing defects. Experimental results confirm high diagnostic accuracy of the proposed scheme and its time efficiency.

Keywords

built-in self test; fault diagnosis; integrated circuit testing; read-only storage; built-in self-test; embedded read-only memory; fault diagnosis; memory array; permanent failure identification; test logic; Arrays; Built-in self-test; Fault diagnosis; Radiation detectors; Read only memory; Registers; Built-in self-test (BIST); deterministic partitioning; discrete logarithms; embedded read-only memory; fault diagnosis;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2011.2127030

Filename

5875994