Title :
Laser and LED reliability update
Author_Institution :
Optoelectron. Lab., NTT, Kanagawa, Japan
fDate :
10/1/1988 12:00:00 AM
Abstract :
The reliability of various types of InGaAsP/InP lasers and LEDs is reviewed with regard to failure modes and systems requirements. A systematic exposition, including the degradation modes that govern lifetime, is given. Optical transmission systems are reviewed in general terms. Surface-emitting LEDs and lasers are mainly discussed; edge-emitting LEDs are considered briefly. Degradation modes of optical devices and spectral aspects of reliability for distributed-feedback (DFB) lasers are described
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; light emitting diodes; optical testing; reliability; reviews; semiconductor junction lasers; DFBL; III-V semiconductors; InGaAsP-InP lasers; degradation modes; distributed-feedback lasers; edge-emitting LEDs; failure modes; reliability; surface-emitting LEDs; Degradation; Distributed feedback devices; Fiber lasers; Laser modes; Light emitting diodes; Optical devices; Optical feedback; Semiconductor lasers; Stimulated emission; Surface emitting lasers;
Journal_Title :
Lightwave Technology, Journal of
