Title :
Fabrication and characterization of narrow-band Bragg-reflection filters in silicon-on-insulator ridge waveguides
Author :
Murphy, Thomas Edward ; Hastings, Jeffrey Todd ; Smith, Henry I.
Author_Institution :
Lincoln Lab., MIT, Lexington, MA, USA
fDate :
12/1/2001 12:00:00 AM
Abstract :
We describe the design, fabrication and measurement of an integrated-optical Bragg grating filter, operating at a freespace wavelength of 1543 nm, based upon a silicon-on-insulator (SOI) ridge waveguide. The measured spectral response for a 4-mm long grating has a bandwidth of 15 GHz (0.12 nm), and shows good agreement with theoretical predictions
Keywords :
Bragg gratings; integrated optics; optical fabrication; optical testing; optical waveguide filters; optical waveguides; ridge waveguides; silicon-on-insulator; 15 GHz; 1543 nm; 4 mm; Bragg grating filter design; Bragg grating filter fabrication; Bragg grating filter measurement; Bragg scattering; SOI ridge waveguide; Si-SiO2; free-space wavelength; grating bandwidth; grating length; integrated-optical Bragg grating filter; narrow-band Bragg-reflection filters; optical planar waveguides; ridge waveguides; silicon-on-insulator ridge waveguides; silicon-on-insulator technology; spectral response; waveguide components; waveguide filters; Bragg gratings; Fabrication; Narrowband; Optical filters; Optical planar waveguides; Optical refraction; Optical waveguide components; Optical waveguide theory; Optical waveguides; Silicon on insulator technology;
Journal_Title :
Lightwave Technology, Journal of
