• DocumentCode
    1554151
  • Title

    Design and performance of the Elefant digitizer IC for the BaBar drift chamber

  • Author

    Dow, S.F. ; Karcher, A. ; Levi, M.E. ; Momayezi, M. ; von der Lippe, H. ; Ando, D.

  • Author_Institution
    E.O. Lawrence Berkeley Nat. Lab., Berkeley, CA, USA
  • Volume
    46
  • Issue
    4
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    785
  • Lastpage
    791
  • Abstract
    A 250,000 transistor full custom integrated circuit for the readout of drift chamber signals has been developed, produced and characterized. The “Elefant” (ELEctronics For Amplitude ´N Timing) Digitizer IC is designed to measure both the charge and the single electron time of arrival of sense wire signals from the BaBar drift chamber. By combining a FADC (flash analog-to-digital converter) and a TDC (time-to-digital converter) for each channel, the digitizer IC can be optimized and simplified, to achieve the physics goals required of the drift chamber while reducing the per channel costs of the electronics. The Elefant IC also implements portions of the BaBar trigger protocols to simplify the connection of the chip to the rest of the BaBar detector. Each IC contains eight complete independent channels. The circuit has been implemented in a 0.8 μm triple metal CMOS process and fabricated in production quantity to fully instrument the BaBar drift chamber and are now in operation. Performance results of the IC will be presented
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; digital readout; drift chambers; nuclear electronics; BaBar drift chamber; Elefant digitizer IC; FADC; TDC; electronics; flash analog-to-digital converter; performance results; readout; time-to-digital converter; triple metal CMOS process; Analog-digital conversion; Application specific integrated circuits; Charge measurement; Current measurement; Electrons; Integrated circuit measurements; Signal design; Time measurement; Timing; Wire;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.790679
  • Filename
    790679