DocumentCode :
1554207
Title :
Fabrication and Characterization of Coaxial p-Copper Oxide/n-ZnO Nanowire Photodiodes
Author :
Hsueh, H.T. ; Chang, S.J. ; Weng, W.Y. ; Hsu, C.L. ; Hsueh, T.J. ; Hung, F.Y. ; Wu, S.L. ; Dai, B.T.
Author_Institution :
Nat. Nano Devices Labs., Tainan, Taiwan
Volume :
11
Issue :
1
fYear :
2012
Firstpage :
127
Lastpage :
133
Abstract :
The deposition of copper oxide onto vertically well-aligned n-ZnO nanowires by sputtering and the fabrication of p-copper oxide/n-ZnO coaxial nanowire photodiodes are reported. It was found that we could change the copper oxidation number to obtain Cu2O/ZnO nanowire photodiode, Cu4O3/ZnO nanowire photodiode and CuO/ZnO nanowire photodiode by simply changing the O flow rate during deposition. It was also found that noise equivalent powers were 6.1 × 10-11, 3.8 × 10-10, and 7.2 × 10-8 W while normalized detectivities were 6.35 × 109, 1.02 × 109, and 5.37 × 106 cmHz0.5 W-1 for the fabricated Cu2O/ZnO nanowire photodiode, Cu4O3 /ZnO nanowire photodiode and CuO/ZnO nanowire photodiode, respectively.
Keywords :
II-VI semiconductors; copper compounds; nanowires; p-i-n photodiodes; photodetectors; sputter deposition; wide band gap semiconductors; zinc compounds; CuO-ZnO; coaxial oxide-nanowire photodiode; low-frequency noise characteristic; noise equivalent powers; normalized detectivities; oxidation number; oxygen flow rate; sputter deposition; Copper; Current measurement; Glass; Photodiodes; Sputtering; X-ray scattering; Zinc oxide; Low-frequency noise characteristic; ZnO nanowires; photodiode;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2011.2159620
Filename :
5876323
Link To Document :
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