• DocumentCode
    1554572
  • Title

    Reliable method for delay-fault diagnosis

  • Author

    Girard, P. ; Landrault, C. ; Pravossoudovitch, S.

  • Author_Institution
    Montpellier Univ. des Sci. et Tech. du Languedoc, France
  • Volume
    27
  • Issue
    20
  • fYear
    1991
  • Firstpage
    1841
  • Lastpage
    1843
  • Abstract
    The class of faults known as delay faults is investigated. The diagnosis process is performed after the detection of a circuit malfunction. Unfortunately, the existing methods for locating time failures on digital circuits have shown certain deficiencies. A new and perfectly reliable method for delay fault diagnosis, based on the symbolic simulation of the fault-free circuit, is presented.
  • Keywords
    delays; fault location; logic testing; circuit malfunction; delay-fault diagnosis; digital circuits; fault-free circuit; logic circuits; reliable method; symbolic simulation; time failures;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911144
  • Filename
    97210
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1554572