DocumentCode
1554749
Title
Open defects in CMOS RAM address decoders
Author
Sachdev, Manoj
Author_Institution
Philips Res. Lab., Eindhoven, Netherlands
Volume
14
Issue
2
fYear
1997
Firstpage
26
Lastpage
33
Abstract
Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects
Keywords
CMOS memory circuits; SRAM chips; design for testability; failure analysis; fault diagnosis; integrated circuit testing; logic testing; CMOS RAM address decoders; conventional march tests; decoder-testing; embedded SRAMs; field failures; hard-to-detect defects; open defects; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Decoding; Logic gates; Logic testing; MOS devices; Read-write memory; Semiconductor device modeling;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.587738
Filename
587738
Link To Document