Title :
Open defects in CMOS RAM address decoders
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects
Keywords :
CMOS memory circuits; SRAM chips; design for testability; failure analysis; fault diagnosis; integrated circuit testing; logic testing; CMOS RAM address decoders; conventional march tests; decoder-testing; embedded SRAMs; field failures; hard-to-detect defects; open defects; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Decoding; Logic gates; Logic testing; MOS devices; Read-write memory; Semiconductor device modeling;
Journal_Title :
Design & Test of Computers, IEEE
