Title :
A 0.6-2.5-GBaud CMOS tracked 3 × oversampling transceiver with dead-zone phase detection for robust clock/data recovery
Author :
Moon, Yongsam ; Jeong, Deog-Kyoon ; Ahn, Gijung
Author_Institution :
Inter-University Semicond. Res. Center, Seoul Nat. Univ., South Korea
fDate :
12/1/2001 12:00:00 AM
Abstract :
For generation of the multiphase clocks for a serializer, a wide-range multiphase delay-locked loop (DLL) is used in the transmitter to avoid the detrimental characteristics of a phase-locked loop (PLL), such as jitter peaking and accumulated phase error. A tracked 3 × oversampling technique with dead-zone phase detection is incorporated in the receiver for robust clock/data recovery in the presence of excessive jitter and intersymbol interference (ISI). Due to the dead-zone phase detection, phase adjustment is performed only on the tail portions of the transition histogram in the received data eye, thereby exhibiting wide pumping-current range, large jitter tolerance, and small phase error. A voltage-controlled oscillator (VCO), based on a folded starved inverter, shows about 50% less jitter than one with replica bias. The transceiver, implemented in 0.25-μm CMOS technology, operates at 2.5 GBaud over a 10-m 150-Ω STP cable and at 1.25 GBaud over a 25-m cable with a bit error rate (BER) of less than 10-13
Keywords :
CMOS integrated circuits; clocks; delay lock loops; intersymbol interference; jitter; phase detectors; synchronisation; transceivers; voltage-controlled oscillators; 0.25 micron; CMOS tracked oversampling transceiver; bit error rate; clock/data recovery; current pumping; dead-zone phase detection; delay-locked loop; folded starved inverter; intersymbol interference; jitter; multiphase clock generation; phase error; serializer; transition histogram; voltage-controlled oscillator; Bit error rate; CMOS technology; Character generation; Clocks; Intersymbol interference; Jitter; Phase detection; Phase locked loops; Transceivers; Voltage-controlled oscillators;
Journal_Title :
Solid-State Circuits, IEEE Journal of