DocumentCode
1554778
Title
Testing Embedded Cores
Author
Chandramouli, R. ; Dey, Shuvashis ; Hemmady, S. ; Mallipeddi, C. ; Rajsuman, R. ; Walther, R. ; Zorian, Y.
Volume
14
Issue
2
fYear
1997
Firstpage
81
Lastpage
89
Keywords
Chip scale packaging; Design methodology; Electronic design automation and methodology; Logic; Manufacturing; National electric code; Registers; System testing; Time to market; USA Councils;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1997.587747
Filename
587747
Link To Document