• DocumentCode
    1554809
  • Title

    Optimal unbiased reduction of global image variances in SPECT

  • Author

    Pan, Xiaochuan

  • Author_Institution
    Dept. of Radiol., Chicago Univ., IL, USA
  • Volume
    46
  • Issue
    4
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    1148
  • Lastpage
    1155
  • Abstract
    In this work, we studied a class of reconstruction algorithms, which are specified by a complex combination coefficient, in SPECT with uniform attenuation. We studied theoretically and evaluated numerically the impact of such a complex combination coefficient on the variances in reconstructed images. Specifically, we investigated whether and to what extent a complex combination coefficient can further reduce the global image variances in SPECT as compared to a real combination coefficient. We show that the algorithm specified by an optimal complex combination coefficient can provide theoretically a lower global image variance than does the the quasi-optimal algorithm that is specified by a real combination coefficient. However, because such a reduction of global image variance is only a few percent, and because the optimal complex combination coefficient is generally unobtainable without prior knowledge of the object, it is concluded that the quasi-optimal algorithm probably should be used for image reconstruction in SPECT with uniform attenuation
  • Keywords
    Radon transforms; image reconstruction; medical image processing; single photon emission computed tomography; 1D Fourier transform; Poisson model; Radon transform; SPECT; Shepp-Logan phantom; complex combination coefficient; global image variances; image reconstruction algorithms; linear estimation; optimal unbiased reduction; quasi-optimal algorithm; sinograms; uniform attenuation; Attenuation measurement; Computed tomography; Image reconstruction; Image sampling; Imaging phantoms; Noise reduction; Nuclear medicine; Radiology; Reconstruction algorithms;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.790849
  • Filename
    790849