• DocumentCode
    1554897
  • Title

    The effect of Gaussian error in object recognition

  • Author

    Sarachik, Karen B.

  • Author_Institution
    Artificial Intelligence Lab., MIT, Cambridge, MA, USA
  • Volume
    19
  • Issue
    4
  • fYear
    1997
  • fDate
    4/1/1997 12:00:00 AM
  • Firstpage
    289
  • Lastpage
    301
  • Abstract
    In model based recognition, the goal is to locate an instance of one or more known objects in an image. The problem is compounded in real images by the presence of clutter, occlusion, and sensor error, which can lead to “false negatives”, failures to recognize the presence of the object, and “false positives”, in which the algorithm incorrectly identifies an occurrence of the object. The probability of either event is affected by parameters within the recognition algorithm, which are almost always chosen in an ad-hoc fashion. The effect of the parameter values on the likelihood that the recognition algorithm will make a mistake are usually not understood explicitly. To address the problem, we explicitly model the noise that occurs in the image. In a typical recognition algorithm, hypotheses about the position of the object are tested against the evidence in the image, and an overall score is assigned to each hypothesis. We use a statistical model to determine what score a correct or incorrect hypothesis is likely to have, and use standard binary hypothesis testing techniques to distinguish correct from incorrect hypotheses. Using this approach, we can compare algorithms and noise models, and automatically choose values for internal system thresholds to minimize the probability of making a mistake
  • Keywords
    Gaussian noise; errors; image recognition; object recognition; probability; Gaussian error; binary hypothesis testing techniques; clutter; correct hypotheses; image; incorrect hypotheses; internal system thresholds; mistake probability minimization; model based recognition; object position hypotheses; object recognition; occlusion; sensor error; statistical model; Error analysis; Feature extraction; Image databases; Image recognition; Image sensors; Layout; Object recognition; Probability; Spatial databases; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.587990
  • Filename
    587990