Title :
An L-band tapered-ridge SIW-to-CPW transition
Author :
Smith, J.N. ; Stander, T.
Author_Institution :
Univ. of Pretoria, Pretoria, South Africa
Abstract :
A tapered ridge transition between coplanar waveguide and substrate-integrated waveguide is presented. The taper is implemented through staircase metallization across 10 layers of conventional RF substrate with sidewall expansion and upper cut-out using Vivaldi-type exponential tapers. Fractional bandwidth of 36% is achieved in the L-band, with insertion loss of 0.5 dB and return loss of 15 dB.
Keywords :
coplanar waveguides; metallisation; ridge waveguides; substrate integrated waveguides; L-band tapered-ridge SIW-TO-CPW transition; RF substrate; Vivaldi-type exponential tapers; coplanar waveguide; fractional bandwidth; insertion loss; return loss; sidewall expansion; staircase metallization; substrate-integrated waveguide; Coplanar waveguides; L-band; Metallization; Rectangular waveguides; Substrates; Waveguide components; Waveguide transitions;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2014 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4799-3437-9
DOI :
10.1109/APEDE.2014.6958741
