DocumentCode :
1555194
Title :
The Finite-Element Method Contrast Source Inversion Algorithm for 2D Transverse Electric Vectorial Problems
Author :
Zakaria, Amer ; LoVetri, Joe
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Manitoba, Winnipeg, MB, Canada
Volume :
60
Issue :
10
fYear :
2012
Firstpage :
4757
Lastpage :
4765
Abstract :
The contrast source inversion algorithm is formulated using the finite-element method for two-dimensional transverse electric microwave imaging problems. Edge-based triangular elements with vector basis functions are utilized to solve the TE electromagnetic problem. A single finite-element method (FEM) mesh is used to model both the electric field as well as the contrast-source and contrast variables used in the inverse problem. The electromagnetic field is modeled by taking the unknown values to be the tangential components of the transverse electric field along the edges of each triangular element. The unknown contrast-source and contrast variables are located at the centroids of every triangular element of the same FEM mesh, but only inside the imaging domain. The adaptation of the FEM-contrast source inversion (FEM-CSI) algorithm to 2D-TE problems on such an arbitrary mesh requires the implementation of special transformation operators which are presented herein. The algorithm´s capabilities are demonstrated by inverting the Fresnel experimental TE datasets as well as synthetically generated data.
Keywords :
electric fields; electromagnetic fields; finite element analysis; microwave imaging; 2D transverse electric vectorial problems; 2D-TE problems; Fresnel experimental TE datasets; arbitrary mesh; contrast source inversion algorithm; contrast variables; edge-based triangular elements; electric field; electromagnetic field; finite-element method; single FEM mesh; synthetically generated data; tangential components; transformation operators; two-dimensional transverse electric microwave imaging problems; Finite element methods; Image edge detection; Image reconstruction; Imaging; Inverse problems; Transmitters; Vectors; Contrast source inversion (CSI); finite-element method (FEM); microwave imaging; transverse-electric;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2012.2207324
Filename :
6236098
Link To Document :
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